SFP1 system benefits
- Automatic changing of the SFP1 probe and stylus holders is possible using the standard MRS rack and RCP ports. This enables surface finish measurement to be fully integrated with the standard CMM inspection program
- The SFP1 probe takes advantage of the infinite positioning capability of the REVO head
- Sensor calibration involves measuring the surface finish of the surface finish calibration artefact (SFA) that is mounted on the MRS rack. The calibration software adjusts parameters within the probe in accordance with the calibrated value for the artefact
- The SFP1 includes a passive C-axis that enables surface finish measurements to be made at all required orientations around a part. The process of changing the C-axis angle is fully automatic, utilising the B-axis positioning of the REVO head to rotate the SFP1
- The SFCP (C-axis port) is mounted on the MRS rack and features spring-loaded pins to facilitate rotation of the C-axis using the REVO head's B axis motion
Contact :
PT DWI SUBUR MAKMUR
JL. Kayu Jati IV No 25
Jakarta Timur ( email: dsm@indo.net.id )
Telp : 021 47869642, 47881968, 4759101
